Yong Chu

NSLS-II HXN Beamline Group Leader, Photon Division


Yong Chu is a physicist in the Photon Science Directorate at Brookhaven National Laboratory. He is the group leader of the Hard X-ray Nanoprobe (HXN) Beamline at the National Synchrotron Light Source II (NSLS-II), responsible for design, construction, commissioning and operation of the HXN. Yong has 20 years of experience in x-ray science and instrumentation. Before joining the NSLS-II, he led development of Transmission X-ray Microscopy (TXM) capabilities at beamline 34-ID and X-ray diffraction microscopy capabilities at beamline 2-BM of the Advanced Photon Source. Yong’s scientific expertise includes X-ray microscopy, X-ray imaging, X-ray diffraction and high-precision instrumentation. Currently, his research focuses on development of ultra-high resolution microscopy capabilities for the HXN beamline and its scientific applications.

Phone: 344-5582
Email: ychu@bnl.gov


Education

  • Ph.D. 1997: Physics, University of Illinois, Urbana
  • M.S. 1990: Physics, University of Illinois, Urbana
  • B.S. 1989: Physics, California Institute of Technology


Key Publications

  • J Shi, D Xiao, M Ge, X Yu, Y Chu, X Huang, X Zhang, Y Yin, X Yang, et al., High-Capacity Cathode Material with High Voltage for Li-Ion Batteries, Adv. Mats., 30, 1705575 (2018).
  • H Yan, N Bouet, J Zhou, X Huang, E Nazaretski, W Xu, A Cocco, W Chiu, K Brinkman, et al., Multimodal hard x-ray imaging with resolution approaching 10 nm for studies in material science, Nano Futures, 2, 11001 (2018).
  • M Hill, I Cavalo-Almazan, M Allain, M Holt, A Ulvestad, J Treu, G Koblmuller, C Huang, X Huang, H Yan, Measuring three dimensional strain and structural defects in a single InGaAs nanowire using coherent x-ray multi-angle Bragg projection ptychography, Nano Lett., 18(2), 811-9 (2018).
  • H Yan, R Conley, N Bouet, Y Chu, Hard X-ray Nanofocusing by Multilayer Laue Lenses, J. Phys. D: Appl. Phys., 47, 263001 (2014).
  • H Yan, Y Chu, Optimization of Multilayer Laue Lenses for a Scanning X-ray Microscope, J. Synch. Rad., 20(1), 89-97 (2013).

All Publications


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