Steven Ehrlich


Steven Ehrlich is the Lead Beamline Scientist for the 7-BM (QAS) beamline.

Professional Activities

Phone: 344-7862
Fax: 631-344-3238


  • Ph.D. 1986: Physics, University of Illinois at Urbana-Champaign
  • M.S. 1979: Physics, University of Illinois at Urbana-Champaign
  • B.S. 1977: Physics, Rensselaer Polytechnic Institute
  • B.S. 1977: Mathematics, Rensselaer Polytechnic Institute


  • X-ray specular reflectivity studies of long alkane films adsorbed on a SiO[SUB]2[/SUB] surface
  • Structure and growth of dotriacontane films on SiO[SUB]2[/SUB] and Ag(111) surfaces

Key Publications

  • S Chattopadhyay, A Uysa, B Stripe, G Evmenenko, S Ehrlich, E Karapetrova, P Dutta, Structural Signal of a Dynamic Glass Transition, Phys. Rev. Lett., 103, 175701 (2009).
  • M Bai, K Knorr, M Simpson, S Trogisch, H Taub, S Ehrlich, H Mo, U Volkmann, F Hansen, Nanoscale Observation of Delayering in Alkane Films, Europhys. Lett., 79, 26003-p1 (2007).
  • H Mo, S Trogisch, H Taub, S Ehrlich, U Volkmann, F Hansen, M Pino, Studies of the Structure and Growth Mode of Dotriacontane Films by Synchroton X-ray Scattering and Molecular Dynamics Simulations, J. Phys.: Condens. Matter, 16, S2905 (2004).
  • Y Zhang, S Ehrlich, R Colella, M Kopecky, M Widom, X-ray Diffuse Scattering in Icosahedral Quasicrystal Al-Pd-Mn, Phys. Rev. B: Condens. Matter, 66, 104202 (2002).
  • D Silva, P Sokol, S Ehrlich, Mobility Transition of Solid Rare Gases in Confined Environments, Phys. Rev. Lett., 88(15), 155701-1 (2002).

All Publications