Kazimierz Gofron

Point of Contact for Complex Scattering


Kazimierz Gofron is a Point of Contact for Complex Scattering program at NSLS2 synchrotron. My role is to provide controls support for the four Complex Scattering beamlines.

The four Complex Scattering beamlines include:
1. Inelastic X-ray Scattering (IXS)
2. Complex Materials Scattering (CMS)
3. Coherent Hard X-ray Scattering (CHX)
4. Soft Matter Interfaces (SMI)

In addition, I provide expert controls support for other beamlines as needed. Currently developing controls for Full Field X-ray Imaging (FXI) beamline, and specifically developing Transmission X-ray Microscope (TXM) hutch instrument.

Professional Activities

Phone: 344-5283
Email: kgofron@bnl.gov


Education

  • Ph.D. 1994: Physics, University of Illinois at Chicago