Physicist, NSLS-II HXN Nanoprobe Beamline, Photon Division
Hanfei Yan earned his B.S. in Physics in 1999 from Peking University, China, and an M.S. in Physics from the University of Massachusetts at Amherst in 2001. He subsequently enrolled in Columbia University's School of Engineering and Applied Science to pursue a Ph.D. in Materials Science and Engineering, starting his research in synchrotron science. He did most of his studies at synchrotron facilities in the U.S., including NSLS at Brookhaven Lab and APS at Argonne National Laboratory in Illinois. After graduating from Columbia University in 2005, Yan accepted a postdoc position at the Center for Nanoscale Materials at Argonne. He played a critical role in the development of novel x-ray focusing optics using a multilayer Laue lens (MLL), developing a theory to address the question of the fundamental focusing limit for X-ray optics and demonstrating experimentally the focusing capability of the MLL.
In 2007, Yan joined the NSLS-II Project to develop the 1-nm focusing optics for the Hard X-ray Nanoprobe (HXN) beamline and has since been leading HXN's R&D efforts. Yan's other research interests include X-ray dynamical diffraction from single crystals and X-ray microscopic techniques.