Joseph Dvorak is a scientist in the Beamline Research and Development Section at NSLS. Part of his responsibilities include the characterization of the xray beam quality at the various beamlines, including ray tracing simulations. He is also involved in the implementation of the hard xray transmission microscopy at X8C.
His research interests involve using soft xray spectroscopy and scattering to study the electronic and structural properties of thin film and nanoparticle systems. He is also interested in the development of optics for the soft xray regime.