D. Peter Siddons

Physicist


D. Peter Siddons is the leader of the Detector Development group. His development efforts are focussed on advanced instrumentation for x-ray synchrotron radiation experiments. This includes the areas of novel perfect crystal x-ray optics and advanced detector systems.

Professional Activities

Phone: 344-2738
Fax: 631-344-3238
Email: siddons@bnl.gov


Education

  • Ph.D. 1979: Kings College, London


Projects

  • Multi-element silicon spectroscopy detector for EXAFS
  • SIlicon microstrip detector
  • Cadmium-Zinc Telluride detectors for hard x-rays
  • Multi-crystal analyzer for powder diffraction
  • High-rate Avalanche Photodiode detector


Key Publications

  • C Ryan, D Siddons, G Moorhead, R Kirkham, G De Geronimo, B Etschmann, A Dragonne, P Dunn, A Kuczewski, et al., High-throughput X-ray fluorescence imaging using a massively parallel detector array, integrated scanning and real-time spectral deconvolution, 9th International Conference on X-ray Microscopy, Vol 186, p. 012013, sponsored by IOP Publishing (2009).
  • G Carini, W Chen, Z Li, P Rehak, D Siddons, X-ray Active Matrix Pixel Sensors Based on J-FET Technology Developed for the Linac Coherent Light Source, IEEE Nuclear Science Symposium 2007, Vol 2, p. 1603-1606, sponsored by IEEE (2007).
  • D Siddons, A Dragone, G De Geronimo, A Kuczewski, J Kuczewski, P O'Connor, Z Li, C Ryan, G Moorhead, et al., A High-Speed Detector System for X-ray Fluorescence Microprobes, 2006 IEEE Nuclear Science Symposium, Medical Imaging Conference and 15th International Workshop on Room-Temperature Semiconductor X-and Gamma-Ray Detectors, Special Focus Workshops, Vol 2, p. 725-728, sponsored by IEEE (2007).
  • M Hart, D P Siddons, Y Amemiya, V Stojanoff, Tuneable x-ray polarimeters for synchrotron radiation sources, Rev. Sci. Instrum., 62, 2540-2544 (1991).
  • D Siddons, Use of Monolithic Elastic Design in X-ray Monochromators, SPIE, High Heat Flux and Synchrotron Radiation Beamlines, Vol 3151, p. 230-242, sponsored by International Society for Optical Engineering (1997).